MRS2019 Fall: Deep Learning Based Automatic Defect Analysis System for Static and Dynamic Electron Microscopy Data

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Materials Research Society(MRS) MT03.03: Autonomous Science (12/01/2019 - 12/06/2019 Boston, MA, USA)

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Mingren Shen, Guanzhao Li, Dongxia Wu, Jack Haley, Wei Li, Hima Bharathi Adusumilli, Jacob Greaves, Wei Hao, Nathaniel J. Krakauer, Leah Krudy, Yuhan Liu, Jacob Perez, Varun Sreenivasan, Bryan Sanchez, Oigimer Torres, Kevin.G. Field, Dane Morgan

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Poster